Concentration dependence of hydrogen diffusion in clamped vanadium (0 0 1) films

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Concentration dependence of hydrogen diffusion in clamped vanadium (0 0 1) films.

The chemical diffusion coefficient of hydrogen in a 50 nm thin film of vanadium (0 0 1) is measured as a function of concentration and temperature, well above the known phase boundaries. Arrhenius analysis of the tracer diffusion constants reveal large changes in the activation energy with concentration: from 0.10 at 0.05 in H V-1 to 0.5 eV at 0.2 in H V-1. The results are consistent with a cha...

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ژورنال

عنوان ژورنال: Journal of Physics: Condensed Matter

سال: 2016

ISSN: 0953-8984,1361-648X

DOI: 10.1088/1361-648x/29/4/045402